Meetings & Conferences

SENSOR+TEST, 19-21 May 2015, Nürnberg, Germany
FORUMESURE, 19-21 May 2015, Algiers, Algeria
Quality Expo in NYC - June 10-11, 2015

May 27-28 Traceability for Computationally Intensive Metrology – Teddington, UK

Two-day workshop on Traceability for Computationally Intensive Metrology

VSL is leading the work packing on reference data generation in the European research project “Traceability for Computationally Intensive Metrology” (TraCIM). One of the goals of this project is to create reference data for computationally intensive tasks like fitting a circle to data points e.g. measured with a coordinate measurement machine (CMM), or fitting a combination of line profile functions to spectroscopic measurement data. Another project aim is to enable users to validate their metrological software over the internet.

Continue reading May 27-28 Traceability for Computationally Intensive Metrology – Teddington, UK

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