Agilent Technologies Application Note on Testing DigRF Interfaces

The new “Solutions for Testing DigRF Interfaces” 5990-9501EN, offers insight into how to quickly and efficiently characterize your digital wireless devices. It is part of a series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.

To request copies of the free application notes go to http://www.agilent.com/find/powerofx. Registration is required