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Home2013June

Month: June 2013

NIST Radio Station WWVB Logs 50 Years of Innovation

June 26, 2013 Office

NIST Tech Beat for June 25, 2013 Fifty years ago on July 5, 1963, a modest radio station in Fort Collins, Colo., officially went on the airwaves—a landmark event for U.S. industry and the American […]

NIST Office of Weights & Measures Receives ‘Continuing Education’ Accreditation

June 21, 2013 Office

From NIST Tech Beat: June 20, 2013 Contact: Mark Esser 301-975-8735 The International Association for Continuing Education and Training (IACET) has awarded the National Institute of Standards and Technology (NIST)Office of Weights and Measures (OWM) an “Authorized Provider” accreditation. IACET […]

Fluke Calibration 3130 Portable Pneumatic Pressure Calibrator

June 13, 2013 Office

EVERETT, Wash., June 13, 2013 /PRNewswire/ — FlukeCalibration, a leader in precision calibration instrumentation and software, introduces the 3130 Portable Pneumatic Pressure Calibrator, a complete system for pressure sensor and pressure gauge calibration, on the bench […]

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  • Surface Roughness and Roundness Measurement: How to Know What Your Gage Can (and Can’t) Measure
  • The Quality System at INRiM: A Research and National Metrology Institute
  • Automating Calibration with LabVIEW: A Practical Guide for Calibration Laboratories – 3rd Continuum
  • Working with Difficult Equipment
  • KIER Successfully Develops Korea-Made “Calibration Thermoelectric Module” for Measuring Thermoelectric Device Performance | KIER Media
  • First Successful Key Comparison of Josephson Voltage Standards for AC Voltage | BIPM News
  • A New Era Unfolds: FARO and Creaform Combine to Form Two New Business Units
  • Trescal Expands Global Footprint with 14 Acquisitions and Entry into India
books business calibration training dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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