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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
  • [ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
  • [ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
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NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News

August 10, 2026 Office
August 6, 2026 Nanoscience, which studies small objects, has a big problem. According to a team of scientists at the National Institute of Standards and Technology (NIST), the field confronts a pervasive error of data […]
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The first stable version of the SI Reference Point | BIPM News

June 18, 2026 Office
Version 1.0.0 of the SI Reference Point has been officially released. The SI Reference Point is a digital representation of the SI Brochure, which defines the International System of Units (SI), the world’s only internationally agreed […]
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Arcline-Backed DwyerOmega Acquires Lake Shore Cryotronics

June 10, 2026 Office
MICHIGAN CITY, Ind., June 10, 2026 /PRNewswire/ — DwyerOmega, a portfolio company of Arcline Investment Management, today announced the acquisition of Lake Shore Cryotronics (“Lake Shore” or the “Company”). The acquisition strengthens DwyerOmega’s precision temperature measurement product offering in […]
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Updated SI Brochure clarifies the status of non-SI units | BIPM News

June 4, 2026 Office
The SI Brochure is the authoritative document describing the International System of Units (SI), the world’s only internationally agreed system of units. The new version introduces revisions to the section on non-SI units and updates […]
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Accuracy records set: Two research groups awarded Helmholtz Prizes | PTB Press Release

June 1, 2026 Office
Although the prefixes ‘nano’, ‘femto’ and ‘atto’ suggest something small, they often conceal significant physics and impressive technology. This year, two research groups have been awarded the Helmholtz Prize for setting accuracy records in their […]
Closeup of metal processing plant worker inspecting certain pieces of finished products. He's making sure that the steel cylinder has proper dimensions. He's using manual caliper device.
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Metrology and Quality Through Education

April 29, 2026 Office
Carson, California, April 29, 2026 — The digital revolution driving how organizations function today is advancing at a pace where the foundational processes that prepare professionals, especially metrologists, with a challenge to remain current. Industry […]
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NIST Weighs In on the Mystery of the Gravitational Constant | NIST News

April 16, 2026 Office
The time had come to open the envelope, but Stephan Schlamminger, a physicist at the National Institute of Standards and Technology (NIST), wasn’t sure he wanted to know the secret number that lay inside. For […]
News

KBR’s Mission Technology Solutions Launches New Phoenix Lab to Advance Precision Measurement for High-Tech Industries

March 17, 2026 Office
Publish date Tue, 03/17/2026 – 12:00 KBR announced today the opening of its new Phoenix Metrology Engineering Center, an internationally accredited 4,500-square-foot facility providing advanced measurement, precision calibration and engineering services to commercial and national […]

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  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
  • Arcline-Backed DwyerOmega Acquires Lake Shore Cryotronics
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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