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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ March 4, 2026 ] Surface Roughness and Roundness Measurement: How to Know What Your Gage Can (and Can’t) Measure Articles
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  • [ January 22, 2026 ] KIER Successfully Develops Korea-Made “Calibration Thermoelectric Module” for Measuring Thermoelectric Device Performance | KIER Media News
Home2020August

Month: August 2020

Precision Metrology Certificate Program | The William States Lee College of Engineering | UNC Charlotte

August 31, 2020 Office

News August 11, 2020 To provide engineers with advanced coursework about dimensional measurement, The William States Lee College of Engineering’s Mechanical Engineering Department and Center for Precision Metrology offer the Graduate Certificate in Precision Metrology […]

Yokogawa Test & Measurement Releases DLM5000 Series Mixed Signal Oscilloscopes

August 28, 2020 Office

Tokyo, Japan – August 28, 2020 Yokogawa Test & Measurement Corporation announces that it has developed the DLM5000 series mixed signal oscilloscopes and will be releasing 350 MHz and 500 MHz models to the market […]

Meeting the Challenge when Measuring Super Smooth Surfaces

August 26, 2020 Office

While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]

NIST’s SAMURAI Measures 5G Communications Channels Precisely | NIST

August 10, 2020 Office

Engineers at the National Institute of Standards and Technology (NIST) have developed a flexible, portable measurement system to support design and repeatable laboratory testing of fifth-generation (5G) wireless communications devices with unprecedented accuracy across a […]

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  • Surface Roughness and Roundness Measurement: How to Know What Your Gage Can (and Can’t) Measure
  • The Quality System at INRiM: A Research and National Metrology Institute
  • Automating Calibration with LabVIEW: A Practical Guide for Calibration Laboratories – 3rd Continuum
  • Working with Difficult Equipment
  • KIER Successfully Develops Korea-Made “Calibration Thermoelectric Module” for Measuring Thermoelectric Device Performance | KIER Media
  • First Successful Key Comparison of Josephson Voltage Standards for AC Voltage | BIPM News
  • A New Era Unfolds: FARO and Creaform Combine to Form Two New Business Units
  • Trescal Expands Global Footprint with 14 Acquisitions and Entry into India
books business calibration training dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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