Why USB VNAs?
USB VNA is the next generation of advanced RF test & instrumentation. Performance, form factor, security and lower cost of ownership make these analyzers ideal for many RF and microwave applications. USB VNAs separate the […]
Articles by Office
A Unified Formula for Uncertainty Estimation in Interlaboratory Studies and Key Comparisons
By Hening Huang A variety of statistical methods are available for estimating consensus values in interlaboratory studies (including key comparisons). These methods, although developed based on different approaches and ranging from simple to complex, produce […]
Cost and Accessibility of Metrology, Calibration, Testing, and NDT Training
By Dennis Destefan and William Hinton It is well accepted in the metrology community that industry does not have a sustainable source of trained calibration professionals. We explore the availability of metrology-related training and its […]
Realized Value of Industry Events
By Hannah Eilers Where can you find the latest metrology news and information, introductory to NMI-level training, and valuable industry connections? All of this can be achieved at annual trade shows. And believe it or […]
Photon drive for quantum flux transfer | PTB News
PTB-News 3.2019 24.09.2019 At PTB, a pulse-driven Josephson standard for the generation of AC voltages has been realized where the voltage pulses are synthesized by means of optical components. This has advantages compared to the […]
Vitrek Launches Best-In-Class Programmable DC Load Product
The Vitrek DL Series offers industry-leading performance in 125W-500W applications; supports best-in-class transient loading capability (from 0.1µW resolution to 14.5kW pulses); features high-speed pulse loading up to 100 kHz; boasts up to ten times better […]
JILA Team Demonstrates Model System for Distribution of More Accurate Time Signals | NIST
October 21, 2019, NIST News – JILA physicists and collaborators have demonstrated the first next-generation “time scale” — a system that incorporates data from multiple atomic clocks to produce a single highly accurate timekeeping signal […]
Pass or Fail: With Which Probability?
by Manuel Rodríguez In this paper, the Probability of Pass (PoP) and the Probability of Fail (PoF) are derived following a metrological approach, in which concepts such as repeatability, number of effective degrees of freedom, […]