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HomeArticlesVol. 25:2 (Apr 2018)

Vol. 25:2 (Apr 2018)

A Comparison of Deadweight Testers and Digital Pressure Calibrators

June 27, 2018 Office

by Sean Nielson When choosing which instrument to use when calibrating pressure, the two most popular choices are deadweight testers and digital pressure gauges/calibrators with a pressure comparator. Each has its advantages and disadvantages. The […]

More on the t-Interval Method and Mean-Unbiased Estimator for Measurement Uncertainty Estimation

June 27, 2018 Office

by Hening Huang This paper further explores the t-interval method and the mean-unbiased estimator for uncertainty estimation with a small number of measurements.  It describes the logic behind the error bound-based definition of uncertainty, which […]

A Risk Based Approach to Calibration Laboratory Infrastructure Modernization

June 27, 2018 Office

by Kevin R. Abercrombie Laboratories are often faced with budget constraints that limit the amount measurement system infrastructure upgrades that can be accomplished in any fiscal year.  This paper describes a risk based approach to […]

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  • Surface Roughness and Roundness Measurement: How to Know What Your Gage Can (and Can’t) Measure
  • The Quality System at INRiM: A Research and National Metrology Institute
  • Automating Calibration with LabVIEW: A Practical Guide for Calibration Laboratories – 3rd Continuum
  • Working with Difficult Equipment
  • KIER Successfully Develops Korea-Made “Calibration Thermoelectric Module” for Measuring Thermoelectric Device Performance | KIER Media
  • First Successful Key Comparison of Josephson Voltage Standards for AC Voltage | BIPM News
  • A New Era Unfolds: FARO and Creaform Combine to Form Two New Business Units
  • Trescal Expands Global Footprint with 14 Acquisitions and Entry into India
books business calibration training dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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