An Introduction to Mass Metrology in Vacuum

November 16, 2011 Office

By Patrick J. Abbott & Zeina J. Jabbour Mass metrology carried out in atmospheric pressure air is suitable for most every critical application. However, mass metrology in vacuum is important in several current research projects. […]

nVision Produces Tamper Proof Digital Records

November 15, 2011 Office

A new update for the nVision Reference Recorder by Crystal Engineering – an Intrinsically Safe, modular device for recording pressure and temperature – focuses on data integrity and user safety. Now, users wanting tamper proof […]

IEST Releases New Edition of Recommended Practice

October 21, 2011 Office

A newly revised Recommended Practice (RP) from the Institute of Environmental Sciences and Technology (IEST) describes a method for characterizing organic compounds outgassed from materials or components exposed to air or gases in cleanrooms and […]

TriNano N100 CMM

October 20, 2011 Office

TriNano: CMMs With Nanometer Uncertainty for a Micro Price TriNano is a new nano/micro CMM to measure objects with sub-millimeter features in three dimensions and with nanometer uncertainty. Current micro CMMs comply with the Abbe […]

Metric Test Acquired by Microlease

October 19, 2011 Office

Silicon Valley-based test equipment specialist will offer more inventory and services with world-class customer support Hayward, CA: 18th October 2011: MetricTest has been acquired by Microlease, the leading test equipment rental and asset management organization […]

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