Electrical characterisation of graphene – NPL

National Metrology Institutes, universities and industry work together to develop novel metrology for electrical characterisation of graphene.

Scientists from NPL, in collaboration with Instituto Nazionale di Ricerca Metrologica (Italy), Graphenea SA (Spain), Das-Nano (Spain), delivered the EMPIR Grace project with the aim of developing novel metrology for electrical characterisation of graphene, to enable standardisation electrical measurements of future graphene-based electronics.

Graphene has become the focus of extensive research efforts to harness the potential for disruptive applications. Advances in manufacturing mean that the material can now be produced on a wafer scale up to 6’’. To harness the opportunity for the development of next generation graphene-based electronic components using wafer scale materials, electrical characterization of graphene is imperative and requires the measurement of work function, sheet resistance, carrier concentration and mobility on a variety of scales (i.e. macro-, micro- and nano-scale).

Source: Electrical characterisation of graphene – NPL