Pushing the Boundaries of Traceable Measurement

May 26, 2015 Office 0

by Mettler-Toledo Calibrated microgram weights enable higher precision in nanotechnology applications In recent years, National Metrology Institutes (NMIs) around the world have fielded increasingly frequent requests for a traceable weighing standard for weights in the […]

An Introduction to Mass Metrology in Vacuum

November 16, 2011 Office 0

By Patrick J. Abbott & Zeina J. Jabbour Mass metrology carried out in atmospheric pressure air is suitable for most every critical application. However, mass metrology in vacuum is important in several current research projects. […]

OHAUS Valor™ 5000 Compact Bench Scales

August 19, 2011 Office 0

Corporation announces the Valor™ 5000 line of standard (6,000d) and high resolution (30,000d) compact bench scales clearly and quickly display results within two seconds. A large, backlit LCD display with multiple weight units provides efficient […]

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