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Home2011March

Month: March 2011

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Product Announcements

Mahr Federal Introduces Next Generation µMaxµm® Digital Indicators

March 10, 2011 Office
Mahr Federal has introduced the next generation of its well-established µMaxµm® line of digital indicators. In addition to the many existing features of µMaxum indicators, the enhanced µMaxum II line offers a wide range of […]
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News

Singapore – Man Jailed for Cheating Traffic Police, Forging Cal Certs

March 3, 2011 Admin
IN THE first case of its kind, a businessman who forged speed camera antenna calibration certificates and cheated the Traffic Police was sentenced to 18 months’ jail on Thursday. Lim Tian Pong, 60, owner of […]
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News

Rainin Instruments Puts RFID Into Pipettes

March 2, 2011 Admin
Mar. 2, 2011 Rainin Instruments, a provider of pipettes used in laboratories around the world, has launched an RFID-enabled family of products. Pipettes—cylindrical laboratory instruments composed of glass or other materials—are utilized by lab workers […]

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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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