by Tom Kimbrell Volume 3:3, May-Jun 1996 Dr. Peter Hydemann, Director of Technology Services at the National Institute of Standards and Technology (NIST) stated recently, “The next 25 years will see dramatic changes in international […]
by Christopher L. Grachanen Volume 13:2, Jul-Sep 2006 In today’s ever aggressive bottom-line protection, cost-cutting environment there are no sacred cows. This is especially true for internal support services. These services are enablers in the […]
by Matthew Gingerell and John A. Jacanin Volume 7:4, Jul-Aug 2000 “Certified” low-conductivity solutions down to 10 microsiemens/cm are readily available for the calibration of conductivity/resistivity instrumentation. Can these standards be relied upon for accurate […]
by David Mendoza Volume 16:4, Oct-Dec 2009 The errors associated with the calibration of broad band UV meters based on the light source used during calibration are well documented but appear to not be very […]
by John Hurll Volume 16:4, Oct-Dec 2009 It is often the case that it will be necessary to provide information in calibration reports about whether or not the stated results for general purpose test and […]
by Richard Fertell Volume 16:3, Jul-Sep 2009 The Meter Convention (Convention du Mètre) is a treaty signed in 1875 that created the International Bureau of Weights and Measures (BIPM), an international organization under the authority […]
by Nicholas Kollerstrom Volume 12:4, Oct-Dec 2005 “Was the Earth measured in remote antiquity?” This was the stirring question with which Berriman opened his book, Ancient Metrology. [1] To be sure, the question had earlier […]
by Rich Pieciak and Kay-Uwe Sander Volume 12:3, Jul-Sep 2005 As a fundamental tool of virtually every microwave and many digital design engineers, the accuracy of a signal generator is critical, whether in the laboratory, […]
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