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HomeMetrology RelatedNewsDiscover NIST Education Resources! | NIST

Discover NIST Education Resources! | NIST

May 27, 2022 Office News
GIF of Candela, SI Unit of Light. Credit: NIST

The National Institute of Standards and Technology (NIST) invites learners of all ages to explore and discover a wide variety of Science, Technology, Engineering, and Mathematics (STEM) resources using the recently launched Education portal and NIST Education STEM Resource Registry (NEST-R).

Source: Discover NIST Education Resources! | NIST

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Head to Head: Photonic Pressure Sensors vs. Mercury-Based Standard

April 21, 2016 Office News
When a team of researchers at NIST’s Physical Measurement Laboratory (PML) first tested a new kind of pressure sensor two years ago, initial results showed it was faster and had higher resolution than the traditional, […]
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Instrumental Scholarships

June 28, 2024 Office News
(Butler, PA) June 26, 2024 – A rare associate degree program in metrology provided by a western Pennsylvania community college has now a record 11 scholarship opportunities applicable to its students as they learn to […]
Books

An Introduction to Measurement Uncertainty

November 11, 2020 Office Books
This introduction to measurement uncertainty is intended for metrology professionals working in calibration laboratories and metrology institutes, as well as students in tertiary-level science and engineering programmes. The subject matter is presented with an emphasis […]
  • What Calibration Evidence Can—and Cannot—Tell You When Buying Used Test Equipment
  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
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  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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