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  • [ May 27, 2026 ] Beyond 4:1: What Calibration Ratios Were Meant to Do Articles
  • [ May 27, 2026 ] Metrology for Newbs: Entering the Community, Not Just the Career Articles
  • [ May 27, 2026 ] Resistance Decade Boxes – Where and How They are Used Articles
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New Accreditation Tool for Auditors and Laboratory Personnel

June 24, 2025 Office
by Christopher L. Grachanen Calibration and Testing laboratories seeking accreditation status or maintaining their existing accreditation status must comply with the requirements denoted in ISO/IEC 17025 General requirements for the competence of testing and calibration […]
Product Announcements

Additel Launches the ADT835 Portable Calibration Bath: Precision Meets Portability

June 17, 2025 Office
Brea, California – Additel Corporation is proud to announce the release of the all-new ADT835 Portable Calibration Bath, a revolutionary solution that sets a new benchmark in portable temperature calibration technology. The ADT835 is engineered […]
Product Announcements

New FSWX signal and spectrum analyzer with novel architecture overcomes limits of today’s analysis methods

June 13, 2025 Office
Munich | 13-Jun-2025 — Rohde & Schwarz is set to revolutionize the field of signal and spectrum analysis with the launch of the FSWX signal and spectrum analyzer, an innovative instrument designed to overcome the […]
Product Announcements

DFB pro 633 – Mode-Hop Free DFB Laser for Semiconductor Metrology and Interferometry

June 6, 2025 Office
(PresseBox) (Gräfelfing, 06.06.2025)  TOPTICA introduces the DFB pro 633, the newest member of our family of mode-hop-free tunable lasers for metrology. “Our DFB pro 633 provides a mode-hop-free tuning range of 200 GHz. Driven by the […]
News

“We transform precision into progress” – PTB.de

June 5, 2025 Office
27 May 2025 — European summit of metrology experts at the Physikalisch-Technische Bundesanstalt (PTB): In the year of the 150th anniversary of the Metre Convention, representatives from all European metrology institutes are traveling to Berlin. […]
Product Announcements

NAPT Announces Game-Changing Proficiency Testing Risk Analysis Module

June 4, 2025 Office
Eagan, MN, June 4, 2025 – The National Association for Proficiency Testing (NAPT), the most trusted name in the metrology community for providing administration, development, software tools, and support for interlaboratory comparisons, is excited to […]
Product Announcements

Yokogawa Test & Measurement Releases SL2000 High-Speed Data Acquisition Unit

May 28, 2025 Office
Tokyo, Japan – May 28, 2025 Yokogawa Test & Measurement Corporation announces the release today of the SL2000 High-Speed Data Acquisition Unit, a ScopeCorder series product with a wide range of data logging functionalities for evaluation and […]
News

NIST Moonlight Data Will Help Satellites Get a More Accurate Look at Earth | NIST News

May 20, 2025 Office
  May 20, 2025  Weather forecasting, mineral prospecting and farming all could improve from a trove of data the National Institute of Standards and Technology (NIST) recently gathered about moonlight, late at night and far […]

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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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