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HomeArticlesVol. 21:1 (Jan 2014)

Vol. 21:1 (Jan 2014)

Jan-Mar 2014 Issue of Cal Lab Magazine

Articles

Tolerances for Non-Linear Analog Resistance Scales

February 18, 2014 Office
By Tom Morgan A method is derived for calculating the resistance tolerances for non-linear resistance scales, whose accuracy tolerances are given in degrees of arc instead of percent of reading or range. Read the Full […]
Articles

Progress in the Theory of the Laminar Tube Thermal Flow Sensor

February 18, 2014 Office
By Thomas O. Maginnis, Ph.D. Thermal mass flow sensing is well established commercially for measurement and control of low gas flows in the semiconductor industry and elsewhere. Yet the basic theory of this critical flow […]
Articles

Leveraging LEAN in the Laboratory

February 18, 2014 Office
By Dean S. Williams What do you do when faced with a doubling of demand with virtually no increase in resources? Go LEAN. That was the approach Duke Energy’s Standards Lab took when it faced […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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