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HomeArticlesVol. 24:1 (Jan 2017)

Vol. 24:1 (Jan 2017)

Articles

How to Determine Resolution Uncertainty

February 23, 2017 Office
by Richard Hogan Resolution uncertainty is the uncertainty in measurement contributed by resolution of measurement equipment. Resolution Uncertainty is a factor that contributes to uncertainty in measurement. Its influence should be considered in every uncertainty […]
Articles

Uncertainty Propagation for Force Calibration Systems

February 23, 2017 Office
by H. Zumbrun and A. Zeinali There are several labs operating throughout the world, whom do not follow a designated guideline for calculating measurement uncertainty for force calibrations. Realizing the need for a guidance document, […]
Articles

The Pendulum and Standards of Measure in the Ancient World

February 23, 2017 Office
by Roland A. Boucher When the French proposed their first metric system in 1723, they had no idea it had been invented by the ancient Mesopotamians 5000 years earlier. Just as the French proposed to […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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