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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ September 10, 2026 ] Setting Calibration Intervals from Your As-Found Data White Papers
  • [ September 3, 2026 ] Practical Use of Dry Block Calibrators Articles
  • [ September 3, 2026 ] On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions Articles
  • [ September 3, 2026 ] The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk Articles
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HomeMetrology Related

Metrology Related

Industry Related News

News

JILA Atomic Clocks Measure Einstein’s General Relativity at Millimeter Scale | NIST News

February 16, 2022 Office
JILA physicists have measured Albert Einstein’s theory of general relativity, or more specifically, the effect called time dilation, at the smallest scale ever, showing that two tiny atomic clocks, separated by just a millimeter or […]
News

New record for comparison of distant ultrastable lasers | NPL News

January 11, 2022 Office
Using cutting-edge optical frequency standards developed at PTB and NPL, the team has been able to demonstrate that their measurement precision is preserved even when transmitted across thousands of kilometers of optical fibre. Source: New […]
News

UCF Develops the World’s First Optical Oscilloscope | University of Central Florida News

December 15, 2021 Office
A team from UCF has developed the world’s first optical oscilloscope, an instrument that is able to measure the electric field of light. The device converts light oscillations into electrical signals, much like hospital monitors […]
Freeware

PT100 Calculator | Fluke Calibration

November 24, 2021 Office
Use this PT100 Calculator to calculate temperature and resistance values from the standard PT100 curves. The online calculator will produce a temperature value from an entered resistance or calculate resistance and thermometer sensitivity values from […]
News

Parliament backs metrology partnership within Horizon Europe | News | European Parliament

November 24, 2021 Office
The partnership on metrology – the science of measurement – also aims to support sales of new innovative products and services through the use and adoption of new metrology capabilities in emerging technologies and to […]
Freeware

Uncertainty Calculator | SandiaPSL.github.io

November 17, 2021 Office
The PSL Uncertainty Calculator is developed by the Primary Standards Lab at Sandia National Laboratories to calculate the combined uncertainty of a system of multiple input parameters. In general, a measurement value is calculated from […]
News

Diode lasers for optical metrology | PTB.de

November 4, 2021 Office
PTBnews 03.2021 — In collaboration with an industrial partner, PTB has developed and assessed a very compact wavelength standard. This standard is based on a diode laser whose frequency is stabilized to transitions of the […]
News

On the path to a “nanometer standard” | PTB.de

November 4, 2021 Office
PTBnews 3.2021 — At PTB, absolute length measurements on a single-crystal silicon gauge block have been performed using imaging interferometry. These measurements have a smaller measurement uncertainty than all previous measurements. They provide more accurate […]

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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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