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HomeMetrology RelatedNewsDiscover NIST Education Resources! | NIST

Discover NIST Education Resources! | NIST

May 27, 2022 Office News
GIF of Candela, SI Unit of Light. Credit: NIST

The National Institute of Standards and Technology (NIST) invites learners of all ages to explore and discover a wide variety of Science, Technology, Engineering, and Mathematics (STEM) resources using the recently launched Education portal and NIST Education STEM Resource Registry (NEST-R).

Source: Discover NIST Education Resources! | NIST

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The ASQ Metrology Handbook

March 31, 2023 Office Books
Published in 2023. 736 pages. ISBN: 978-1-63694-019-9. Order from ASQ Book Store. Available in Print or Digital. Developed by experts in the field a s a comprehensive and practical reference, The ASQ Metrology Handbook, Third Edition provides […]
Articles

Temperature Calibrations, Part 1

March 29, 2021 Office Articles, Vol. 28:1 (Jan 2021)
by Ryan Egbert & Joseph Rindone The following article is part one of a four-part Metrology 101 series focusing on temperature. The written content provided here is also intended to be combined with demonstration videos […]
News

First Successful Key Comparison of Josephson Voltage Standards for AC Voltage | BIPM News

January 15, 2026 Office News
The BIPM and PTB have completed the first key comparison of Josephson voltage standards for AC voltage, marking an important step in strengthening global traceability for electrical measurements. Source: 2026-01-15-First-successful-key-comparison-of-Josephson-voltage-standards-for-AC voltage – BIPM
  • Summit Technology Highlights PK4564-PRO System for Complete Electrical & Power Services Power and Power-Quality Data Gathering and Analysis
  • Cal-Toons 2027 Calendar
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business digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature time & frequency
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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