by Dave Abell and Jon Moens
Volume 9:4, Oct-Dec 2002
Calculating measurement uncertainties for a single parameter such as DC voltage is relatively straightforward, but to do so for a complex microwave spectrum analyzer that relies on digital signal processing is another matter. This paper explore how Agilent Technologies finds a balance between a metrologically correct ISO 17025 calibration and the needs of the equipment end-user.
