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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ October 20, 2026 ] Selecting the Right Calibration Method for VNA Measurement White Papers
  • [ October 16, 2026 ] The 28th Meeting of the CGPM News
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Mitutoyo Training & Education

February 12, 2025 Office Online & Independent Study

Mitutoyo offers classroom training, eLearning, virtual training, and on-demand resources across a wide variety of measurement related topics to get you the training and education you need.

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Articles

Dimensional Measurement Uncertainty from Data, Part 1: Check Standards

September 7, 2015 Office Articles, Vol. 22:3 (Jul 2015)
by Ted Doiron Uncertainty has proven difficult to implement in calibrations labs. The subject has advanced mathematics and statistics that are often needed for scientific research, but are seldom needed to develop uncertainty budgets for […]
White Papers

Meeting the Challenge when Measuring Super Smooth Surfaces

August 26, 2020 Office White Papers
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]
Articles

Surface Roughness and Roundness Measurement: How to Know What Your Gage Can (and Can’t) Measure

March 4, 2026 Office Articles, Vol. 33:1 (Jan 2026)
by Mike Zecchino, Jeff Dax, and Mark Cobb Many instruments can be used to measure surface roughness and texture—from handheld gages to ultra-precise interferometers and 3D optical profilers. But not all instruments are intended for […]
  • Selecting the Right Calibration Method for VNA Measurement
  • The 28th Meeting of the CGPM
  • What Calibration Evidence Can—and Cannot—Tell You When Buying Used Test Equipment
  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
business digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature time & frequency
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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