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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ August 24, 2026 ] Surface Roughness, Texture, and Tribology Online & Independent Study
  • [ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
  • [ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
  • [ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
  • [ July 1, 2026 ] Vitrek Introduces Intelligent Cable Test Automation Solution Product Announcements
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News

Trump cuts threaten a measurement lab critical for advanced chips and medical devices | NPR

March 26, 2025 Office
March 26, 202511:44 AM ET Heard on All Things Considered The Trump administration is planning to close a small, obscure laboratory whose work undergirds everything from microchip manufacturing to nuclear fusion. The Atomic Spectroscopy Group […]
News

A milestone for hydrogen metrology | PTB News

January 31, 2025 Office
In cooperation with European metrology institutes and partner companies from industry, PTB has laid the foundations for a reliable infrastructure for the volume measurement of liquid and gaseous hydrogen. For the first time, a traceability […]
News

NIST OWM and KEBS: Building Metrology Capacity for the RMOs | NIST

January 30, 2025 Office
January 7, 2025 NIST Office of Weights and Measures (OWM) and the Kenya Bureau of Standards (KEBS) are currently conducting an interlaboratory mass comparison as part of a larger, multifaceted mass metrology training program being developed by […]
News

New Atom-Based Thermometer Measures Temperature More Accurately | NIST News

January 24, 2025 Office
Scientists at the National Institute of Standards and Technology (NIST) have created a new thermometer using atoms boosted to such high energy levels that they are a thousand times larger than normal. By monitoring how […]
News

In-situ rotary table calibration – PTB.de

January 8, 2025 Office
PTB-News 3.2024 – The deviations of rotary tables can be directly measured on coordinate measuring machines (CMMs) in all six degrees of freedom by means of a self-calibrating procedure using a ball plate. A new […]
News

NIST Offers New Calibration Service for Wavemeters | NIST Updates

December 30, 2024 Office
December 23, 2024 For more than three decades, the National Institute of Standards and Technology (NIST) has calibrated the wavelengths of lasers used in industry, academia, and government laboratories. NIST has now expanded its service […]
News

New Pilot Study Enhances Accuracy of AC Voltage Comparisons – BIPM

October 24, 2024 Office
The BIPM and NIST have successfully conducted a new pilot study, marking a significant advancement in the accuracy and reliability of ac voltage comparisons. This achievement represents a major step forward for on-site comparisons of […]
News

CHIPS for America Releases METIS Data Exchange Ecosystem for Supporting Metrology Innovation | NIST Updates

September 26, 2024 Office
September 26, 2024 — Today, CHIPS for America released a beta version of the Metrology Exchange to Innovate in Semiconductors (METIS). A major milestone for the CHIPS Metrology Program, METIS will give stakeholders access to […]

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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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About Us
Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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