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Home2010April

Month: April 2010

17-2 (Apr 2010)

Metrology for a Competitive Advantage

April 1, 2010 Office
Metrology impacts the entire product life cycle (PLC). From R&D to product shipment, metrology systems and their data are used to: establish product specifications, determine if the results of a specific measurement conform to stated […]
17-2 (Apr 2010)

Manual/Automated Decade Resistance Using Microcontroller Technique

April 1, 2010 Office
An ordinary decade resistance is made of ten resistive elements for obtaining ten resistance values with a constant step. A resistance box is composed of more than one decade. In this paper, a new design […]
17-2 (Apr 2010)

Uncertainty Considerations for Gas Flow Rate Reference Measurement Systems

April 1, 2010 Office
Gas flow rate measurement devices are usually calibrated in secondary flow laboratories and the lower level measurement standards are conducted to the traceability chain by the primary or national measurement standards which are established and […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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