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Home2011April

Month: April 2011

News

East Hills Instruments Inc. Acquires Applied Resources Inc.

April 26, 2011 Office
East Hills Instruments Inc. announced today the acquisition of Applied Resources Inc. Although the purchase price was not disclosed industry sources speculate that the annual sales combined with inventory and its proprietary assets including the […]
News

Transcat Completes Acquisition of CMC Instrument Services, Inc.

April 6, 2011 Admin
Transcat, Inc. (Nasdaq: TRNS) (“Transcat” or the “Company”), a leading distributor of professional grade handheld test and measurement instruments and accredited provider of calibration, repair and weighing system services, announced today that it has completed […]
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Product Announcements

Oak Ridge National Laboratory Low Air Velocity Calibrations

April 1, 2011 Office
The Oak Ridge National Laboratory’s (ORNL’s)  Metrology Lab was recently accredited by the National Voluntary Laboratory Accreditation Program (NVLAP) for Low Air Velocity Calibrations over the range of 0.25 to 6.4 m/s (50-1260 ft/min) using […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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