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Home2012February

Month: February 2012

19-1 (Jan 2012)

Metrology 101: Calibrating 1 mW 50 MHz Power Reference Output

February 22, 2012 Office
By Hock Eng Lim This latest Metrology 101 articles shows us how to use new standards to calibrate the reference calibration output of a power meter. Read the Full Article (PDF)
19-1 (Jan 2012)

Comparison of Uncertainty Calculation Models

February 22, 2012 Office
By Hening Huang Three models are available in the literature for calculating the expanded uncertainty using the experimental standard deviation: the Student’s t model, Craig model, and Bayesian model. This paper compares these three models […]
19-1 (Jan 2012)

Calibrating Low-Temperature Radiation Thermometers

February 22, 2012 Office
By Peter Saunders The advent of low-cost handheld radiation thermometers, or infrared (IR) thermometers, has led to a proliferation of non-contact temperature measurement in the food, building, and low-temperature processing industries. These thermometers typically measure […]
19-1 (Jan 2012)

Alaska Metrology & Calibration Services

February 22, 2012 Office
by Sita Schwartz This editor recently networked up with business owner, Clinton Schirard, out of Anchorage, Alaska. His situation is unique in that he operates a mobile unit in an especially extreme environment. How many […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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