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Home2013February

Month: February 2013

Articles

Verifying 1 mW 50 MHz Power Reference Output SWR

February 19, 2013 Office
by Charles Sperrazza Verification of the Standing Wave Ratio (SWR) of the 50 MHz 1 mW output power reference is a key step in performing a calibration of a RF power meter. Higher than desired […]
Articles

Stating Best Uncertainties Over a Range of Values

February 19, 2013 Office
by David Deaver The Guides to Measurement Uncertainty (GUMs) give very prescriptive methods for calculating measurement uncertainty at individual points. Some laboratories undertake the calculation of uncertainty at many points and state them in their […]
Articles

An Uncertainty Analysis for a Positive Displacement Liquid Flow Calibrator Using the Water Draw Technique

February 19, 2013 Office
by Wesley B. England This paper is an uncertainty analysis performed by the Liquid Flow Lab of the Army Primary Standards Laboratory (APSL) for the calibration of positive displacement piston prover using a volumetric water […]
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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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