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Home2020August

Month: August 2020

News

Precision Metrology Certificate Program | The William States Lee College of Engineering | UNC Charlotte

August 31, 2020 Office
News August 11, 2020 To provide engineers with advanced coursework about dimensional measurement, The William States Lee College of Engineering’s Mechanical Engineering Department and Center for Precision Metrology offer the Graduate Certificate in Precision Metrology […]
Product Announcements

Yokogawa Test & Measurement Releases DLM5000 Series Mixed Signal Oscilloscopes

August 28, 2020 Office
Tokyo, Japan – August 28, 2020 Yokogawa Test & Measurement Corporation announces that it has developed the DLM5000 series mixed signal oscilloscopes and will be releasing 350 MHz and 500 MHz models to the market […]
White Papers

Meeting the Challenge when Measuring Super Smooth Surfaces

August 26, 2020 Office
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]
News

NIST’s SAMURAI Measures 5G Communications Channels Precisely | NIST

August 10, 2020 Office
Engineers at the National Institute of Standards and Technology (NIST) have developed a flexible, portable measurement system to support design and repeatable laboratory testing of fifth-generation (5G) wireless communications devices with unprecedented accuracy across a […]
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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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