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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ September 10, 2026 ] Setting Calibration Intervals from Your As-Found Data White Papers
  • [ September 3, 2026 ] Practical Use of Dry Block Calibrators Articles
  • [ September 3, 2026 ] On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions Articles
  • [ September 3, 2026 ] The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk Articles
  • [ September 3, 2026 ] Hard Work Pays in the End Automation Corner
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Articles

The Metrology of Counting Protein Particles

August 15, 2013 Office
by Dean C. Ripple, Michael J. Carrier, Richard E. Cavicchi, Christopher B. Montgomery, and Zhishang Hu A common degradation pathway for protein-based drugs is the growth of protein aggregates or particles. Counting and characterization of […]
Articles

Metrology 101: Testing Linearity on Agilent E441xA Power Sensors

August 15, 2013 Office
by Michael Schwartz Today’s new high dynamic range power sensors are not built the same as the older generations of sensors. Older generations of power sensors only had a correction table for their frequency response. […]
Product Announcements

INSCO 737 Dry Block Calibration System

August 12, 2013 Office
INSCO is pleased to present the 737 Dry Block Calibration System. Like all INSCO products, the instrument is designed and built to insure exact precision and outstanding quality. The INSCO 737 is a high accuracy […]
Metrology Related

E.U. and U.S. to Extend Scientific Cooperation on Measurements and Standards

July 23, 2013 Office
From: NIST’s Tech Beat July 23, 2013 The European Commission’s Joint Research Centre (JRC) and the U.S. Department of Commerce’s National Institute of Standards and Technology (NIST) agreed to expand their current scientific cooperation to […]
Metrology Related

NIST Radio Station WWVB Logs 50 Years of Innovation

June 26, 2013 Office
NIST Tech Beat for June 25, 2013 Fifty years ago on July 5, 1963, a modest radio station in Fort Collins, Colo., officially went on the airwaves—a landmark event for U.S. industry and the American […]
Metrology Related

NIST Office of Weights & Measures Receives ‘Continuing Education’ Accreditation

June 21, 2013 Office
From NIST Tech Beat: June 20, 2013 Contact: Mark Esser 301-975-8735 The International Association for Continuing Education and Training (IACET) has awarded the National Institute of Standards and Technology (NIST)Office of Weights and Measures (OWM) an “Authorized Provider” accreditation. IACET […]
Product Announcements

Fluke Calibration 3130 Portable Pneumatic Pressure Calibrator

June 13, 2013 Office
EVERETT, Wash., June 13, 2013 /PRNewswire/ — FlukeCalibration, a leader in precision calibration instrumentation and software, introduces the 3130 Portable Pneumatic Pressure Calibrator, a complete system for pressure sensor and pressure gauge calibration, on the bench […]
Metrology Related

“Measurements in Daily Life” Video by VSL

May 30, 2013 Office
This year’s the theme for World Metrology Day was “Measurements in daily life.” Especially for this occasion, VSL developed a short film showing the impact of measurements in our immediate surroundings. You’ll be amazed how […]

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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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