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HomeArticles17-2 (Apr 2010)

17-2 (Apr 2010)

April 2010 Issue of Cal Lab Magazine

17-2 (Apr 2010)

Metrology for a Competitive Advantage

April 1, 2010 Office
Metrology impacts the entire product life cycle (PLC). From R&D to product shipment, metrology systems and their data are used to: establish product specifications, determine if the results of a specific measurement conform to stated […]
17-2 (Apr 2010)

Manual/Automated Decade Resistance Using Microcontroller Technique

April 1, 2010 Office
An ordinary decade resistance is made of ten resistive elements for obtaining ten resistance values with a constant step. A resistance box is composed of more than one decade. In this paper, a new design […]
17-2 (Apr 2010)

Uncertainty Considerations for Gas Flow Rate Reference Measurement Systems

April 1, 2010 Office
Gas flow rate measurement devices are usually calibrated in secondary flow laboratories and the lower level measurement standards are conducted to the traceability chain by the primary or national measurement standards which are established and […]
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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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