17-1 (Jan 2010) – Cal Lab Magazine

Practical Aspects of High Resistance Measurements

March 31, 2010 Office

By Roman Honig We can observe an increased interest in high resistance measurements in the range of MΩ to TΩ. This may be related to recent inter-laboratory comparisons in this area, or to increasing activities […]

Pressure-Indicating Film Characterization of Wafer-to-Wafer Bonding

March 31, 2010 Admin

Wafer-to-wafer bonding has become an enabling semiconductor technology in industries such as 3D packaging, MEMS, MOEMS, and SOI. In a typical wafer bonding process, two flat substrates are permanently joined (bonded) to one another by […]

Some Factors That May Affect the Calibration Accuracy of Universal Testing Machines

March 31, 2010 Office

The calibration of universal testing machines using calibrated force transducers (load cells) is very important for industry and research institutions in any country in the world. Some factors may affect the calibration results considerably. This […]