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Articles

Articles Published in Cal Lab Magazine

18-2 (Apr 2011)

High Attenuation Measurement of Step Attenuators

June 14, 2011 Office
By Sulan Zhang This paper introduces a solution for high attenuation measurement of step attenuators. Fundamentally, this high attenuation measurement method is based on the cascaded 2-port network and S-parameter theory. This method is to […]
18-2 (Apr 2011)

Balance Calibration – A Method for Assigning a Direct-Reading Uncertainty to an Electronic Balance

June 14, 2011 Office
By Mike Stears Like many calibration laboratories, our laboratory provides calibrations for a wide range of instrumentation. For the most part, we calibrate the instrumentation to the manufacturer’s published specifications. As one of our services, […]
18-2 (Apr 2011)

Metrology 101: How to Calibrate a Single Channel Adjustable Volume Pipette

June 14, 2011 Office
By Ann Lenhardt Training Objective: Enable the pipette user to assess the performance of a single channel adjustable volume pipette. The method used for the performance analysis is the gravimetric method. Read the Full Article […]
18-1 (Jan 2011)

A Paperless Calibration Department

March 12, 2011 Office
by Jay Bucher As metrology/calibration departments need to comply with various requirements, such as 21 CFR Part 11 and ISO 13485, they find their processes increasingly need to be more dependent on electronic systems. The […]
18-1 (Jan 2011)

The Effect of High Transverse Inputs on Accelerometer Calibration

March 12, 2011 Office
by Richard W. Bono, Eric J. Seller ISO 16063 part 21 defines the back-to-back comparison technique for accelerometer calibration. Included in its most recent revision is a recommendation for acceptable limits on shaker transverse motion […]
18-1 (Jan 2011)

Development of the New Line Scale Calibration Facility at the Dutch National Metrology Institute VSL

March 12, 2011 Office
by Richard Koops, Ancuta Mares, Jan Nieuwenkamp Line scales are important physical standards of length used for accurate positioning or measurement in one, two or three dimensions. Depending on the application, line scales can have […]
18-1 (Jan 2011)

Metrology 101: How to Function Check a Spectrum Analyzer

March 12, 2011 Office
by Brien Gauthier Increase your efficiency and effectiveness by focusing in on any major problems your test unit may have with a quick and simple function check. The analyzer used for the example is an […]
17-4 (Oct 2010)

A New Compact Low-Cost 1kN Force Standard at NIS, Egypt

October 1, 2010 Office
By M.I. Mohamed, A. Abu-Sinna, and A. Abu El-Ezz The National Institute for Standards (NIS), Egypt, has developed and constructed a new primary force standard, a 1kN deadweight machine (DWM) at its facility in Egypt. […]

Posts pagination

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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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