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HomeArticlesVol. 26:2 (Apr 2019)

Vol. 26:2 (Apr 2019)

Articles

Probability of False Acceptance Estimation for Asymmetrical Tolerances

July 15, 2019 Office
by Pedro Adame One of the newest, hence less studied standards for calibration is the ANSI/NCSL International Z540.3 standard. The main difference with the more known ISO/IEC 17025 standard is the need to estimate and […]
Articles

The Importance of Adapters in Force Measurement

July 15, 2019 Office
by Henry Zumbrun Think about that for a minute.  Would you want a surgeon to operate on you with kitchen utensils such as a serrated knife?  There are several force measurement errors that can result […]
Articles

Creating Sustainable Metrology Software

July 15, 2019 Michael Schwartz
We are currently in a 30 year old software rut.  There is nothing new on the market designed specifically for metrology.  This paper is on both the direction the rest of the software industry is […]
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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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