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HomeArticlesVol. 31:2 (Apr 2024)

Vol. 31:2 (Apr 2024)

Articles

Thermistor Calibration for High Accuracy Measurements

July 26, 2024 Office
by Terry Nagy Technicians and engineers often use thermistors to measure temperature in applications which require high accuracy. Thermistors operate by changing resistance as their temperature changes in a very predictable but non-linear way. This […]
Articles

Selecting a Reputable Proficiency Test Provider

July 26, 2024 Office
by Christopher L. Grachanen A proficiency test (PT) is a blind test to participants that is intended to prove or disprove participant’s measurement or testing competence. Any action that breaks the integrity of that process […]
Articles

IECEE Ruling and Its Impact on Internal Calibration Laboratories

July 26, 2024 Office
by Tim Osborne In this article, we aim to identify why and in what ways the IECEE changed its ruling on internal calibrations, share some of the major pros and cons of performing internal calibrations, […]
Automation Corner

Metrology Digitalization Workshop

July 26, 2024 Michael Schwartz
Last week, I had the privilege of presenting at NCSLI’s first annual “Metrology Digitalization Workshop,” a significant milestone in our field. I couldn’t help but reflect on the journey we’ve taken since 2002, when my […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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