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HomeArticlesVol. 32:4 (Oct 2025)

Vol. 32:4 (Oct 2025)

Articles

How Connector Quality Impacts Measurement Precision

December 12, 2025 Office
by Betty Wang Let’s start with a direct question: To save a few dollars on a connector, are you willing to sacrifice the integrity of a measurement worth thousands, or even risk the safety of […]
Articles

Risks and Limitations of a Three-Point Calibration Program in the Regulated Industry

December 12, 2025 Office
by Ricardo Vilmenay This article not only exposes some of the technical risks associated with calibrating at only three points but also focuses on one of the most common and difficult-to-detect errors: the Type “S” […]
Articles

Welcoming New Calibration Technicians the Right Way

December 12, 2025 Office
by Joseph Rindone Bringing new technicians into a calibration lab is more than an HR formality—it’s an investment in the accuracy, reliability, and reputation of the entire organization. Too often, onboarding is treated as a […]
Automation Corner

Computers Can Do Math!

December 11, 2025 Michael Schwartz
Today, in a meeting, we discussed separating raw data from its presentation. It is such a simple concept, but explaining the purpose of each one is more complex than I expected. So I’m dedicating this […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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