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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ September 10, 2026 ] Setting Calibration Intervals from Your As-Found Data White Papers
  • [ September 3, 2026 ] Practical Use of Dry Block Calibrators Articles
  • [ September 3, 2026 ] On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions Articles
  • [ September 3, 2026 ] The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk Articles
  • [ September 3, 2026 ] Hard Work Pays in the End Automation Corner
HomeMetrology Related

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Freeware

Free MET/CAL® Procedures for Keysight Oscilloscopes

October 21, 2013 Office
Available through Cal Lab Solutions, Inc., Keysight Technologies has made MET/CAL® calibration procedures available for download for select MSO-X and DSO-X series oscilloscopes, free of cost!
Metrology Related

Agilent Technologies to Separate into Two Industry-Leading Public Companies

September 21, 2013 Office
Electronic Measurement Business to be Distributed to Shareholders Through a Tax-Free Spinoff Increases Strategic Flexibility of Both Standalone Businesses SANTA CLARA, Calif., Sept. 19, 2013 Agilent Technologies Inc. (NYSE: A) today announced plans to separate […]
Metrology Related

E.U. and U.S. to Extend Scientific Cooperation on Measurements and Standards

July 23, 2013 Office
From: NIST’s Tech Beat July 23, 2013 The European Commission’s Joint Research Centre (JRC) and the U.S. Department of Commerce’s National Institute of Standards and Technology (NIST) agreed to expand their current scientific cooperation to […]
Metrology Related

NIST Radio Station WWVB Logs 50 Years of Innovation

June 26, 2013 Office
NIST Tech Beat for June 25, 2013 Fifty years ago on July 5, 1963, a modest radio station in Fort Collins, Colo., officially went on the airwaves—a landmark event for U.S. industry and the American […]
Metrology Related

NIST Office of Weights & Measures Receives ‘Continuing Education’ Accreditation

June 21, 2013 Office
From NIST Tech Beat: June 20, 2013 Contact: Mark Esser 301-975-8735 The International Association for Continuing Education and Training (IACET) has awarded the National Institute of Standards and Technology (NIST)Office of Weights and Measures (OWM) an “Authorized Provider” accreditation. IACET […]
Metrology Related

“Measurements in Daily Life” Video by VSL

May 30, 2013 Office
This year’s the theme for World Metrology Day was “Measurements in daily life.” Especially for this occasion, VSL developed a short film showing the impact of measurements in our immediate surroundings. You’ll be amazed how […]
Metrology Related

WorkPlace Training Metrology Academy – Boca Raton, FL

May 16, 2013 Office
WorkPlace Training, Emc3 Solutions and Quality Systems Laboratory announce the opening of a World Class  ISO 17025 accredited training facility in Boca Raton FL.   Our new 11,600 sq ft facility contains the most state of […]
Metrology Related

VSL Supports IRMM in Small Current Measurements for Radionuclide Metrology

March 28, 2013 Office
The accurate measurement of small electrical currents is essential for the measurement of ionizing radiation as generated by radionuclides. The Dutch Metrology Institute (VSL) has been involved in the current measurement part of the development […]

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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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