Metrology Related – Page 32

Improving Safety Measures and Measures of Safety for World Metrology Day 2012

May 17, 2012 Office

From NIST Tech Beat: May 17, 2012 World Metrology Day celebrates the signing of the Treaty of the Meter on May 20, 1875. By signing the treaty, representatives from 17 nations, including the United States, […]

Fluke Calibration Launches Online Calibration Community

April 18, 2012 Office

FlukeCalibration, a leader in precision calibration instrumentation and software, introduces the new, online Calibration Community, an information sharing platform that connects calibration and metrology professionals and experts. Initial discussion groups in the community are focused […]

Two New Advanced Laboratories Open at NIST Boulder and JILA

April 17, 2012 Office

Two new advanced laboratory buildings for high-precision science and measurements have officially opened in Boulder, Colo., providing upgraded facilities to support technology innovation and economic growth as well as the training of future scientists.

News

IET Purchases 1900 Series / 7600 LCR Meters from QuadTech

January 26, 2012 Office

IET Labs, is a leading provider of Decade Resistor, Inductance and Capacitor Standards, Megohmmeters, Stroboscopes and Digibridge LCR Meters, announces that it has purchased the 1910, 1920 and 7600 Plus Precision LCR Meter Products from […]

QuadTech Acquired by Chroma Systems Solutions

January 6, 2012 Office

New England Based Safety Test Equipment Specialist teams with Chroma to Increase Power Testing Product Offering. Move expands Chroma’s Sales and Services capabilities to Eastern USA. Chroma Systems Solutions, Inc. (CSS) announced the acquisition of […]

NIST Releases Reference Material for Single-Wall Carbon Nanotubes

December 20, 2011 Office

From NIST Tech Beat: December 20, 2011 The National Institute of Standards and Technology (NIST) has issued the world’s first reference material for single-wall carbon nanotube soot. Distantly related to the soot in your fireplace […]

Fluke Application Notes – Temperature

November 29, 2011 Office

Download Fluke Calibration’s application note, Temperature Measurement and Calibration: What Every Instrument Technician Should Know, which will help you chart your course to understanding temperature sensor types, traceability, accuracy and the equipment required to calibrate […]

Redefining the SI Base Units

November 22, 2011 Office

Metrology is poised to undergo a profound change that will benefit scientists, engineers, industry and commerce – but which almost no one will notice in daily life. The international General Conference on Weights and Measures […]