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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ September 10, 2026 ] Setting Calibration Intervals from Your As-Found Data White Papers
  • [ September 3, 2026 ] Practical Use of Dry Block Calibrators Articles
  • [ September 3, 2026 ] On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions Articles
  • [ September 3, 2026 ] The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk Articles
  • [ September 3, 2026 ] Hard Work Pays in the End Automation Corner
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Articles

The Metrology of PCB Signal Integrity

November 16, 2015 Office
by Chris Grachanen High speed data computations and routing rely on incredibly complex circuit board designs with data transfer rates fast approaching picosecond timing precision (that is one trillionth or one millionth of one millionth […]
Articles

Accelerate TDR Measurements with Electronic Calibration

December 4, 2014 Office
by John Dorighi and Rob Sleigh An important consideration for improving the accuracy of time domain reflectometer (TDR) measurements is user calibration. A TDR user calibration is performed to correct for systematic instrument errors along […]
Articles

Metrology 101: The Effect of Cables and Shields on Traceability

May 20, 2014 Office
by Jesse Morse If a person making a dc or low frequency measurement fails to select the proper cables, or to properly connect the shields the traceability chain for that measurement can be violated. This […]
Articles

Tolerances for Non-Linear Analog Resistance Scales

February 18, 2014 Office
By Tom Morgan A method is derived for calculating the resistance tolerances for non-linear resistance scales, whose accuracy tolerances are given in degrees of arc instead of percent of reading or range. Read the Full […]
Product Announcements

Transmille’s New 1000 Ultra Portable Calibrator

October 1, 2013 Office
The New Transmille 1000 Series Calibrators are set to transform the world of calibration – the completely new design utilizes the latest in cutting edge digital and analog electronics, combined with modern manufacturing techniques to […]
Product Announcements

New Fluke Calibration 5730A Multifunction Calibrator

September 23, 2013 Office
For 25 years, you’ve trusted the reliability, accuracy and ease of use of Fluke 5700 Series calibrators. Now the Fluke Calibration 5730A Multifunction Calibrator raises that standard of performance for a new generation. Features include: […]
Metrology Related

VSL Supports IRMM in Small Current Measurements for Radionuclide Metrology

March 28, 2013 Office
The accurate measurement of small electrical currents is essential for the measurement of ionizing radiation as generated by radionuclides. The Dutch Metrology Institute (VSL) has been involved in the current measurement part of the development […]
Product Announcements

Yokogawa Announces WT300 Digital Power Meters

January 10, 2013 Office
Yokogawa announces its latest family of Digital Power Meters, the WT300 series. This new addition to Yokogawa’s highly recognized digital power analyzer product line is the 5th generation of its high performance, low cost product […]

Posts pagination

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  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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