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Home2014May

Month: May 2014

Articles

Laboratory Management: An Introduction

May 20, 2014 Office
by Kenneth Parson This article covers the subject of laboratory quality/ management and address the issue of laboratory accreditation. I hope you will find this article interesting and informative and will help you to improve […]
Articles

Uncertainty Estimation Based on Repeated Observations of a Population of Instruments

May 20, 2014 Office
by Jonathon Harben This paper explores the similarities and differences between a measurement uncertainty as described in the GUM and a manufacturer’s specification when the history of compliance testing results is taken into consideration. It […]
Speed of Sound Variation
Articles

Speed-of-Sound Measurements in Liquids Using Time-of-Flight Sensors

May 20, 2014 Office
by Christoph von Rohden Potentials and limitations of commercial sensors for in-situ speed-of-sound measurements in liquids working with the time-of-flight principle are discussed on the basis of laboratory investigations and an extended sensor calibration in […]
Articles

Metrology 101: The Effect of Cables and Shields on Traceability

May 20, 2014 Office
by Jesse Morse If a person making a dc or low frequency measurement fails to select the proper cables, or to properly connect the shields the traceability chain for that measurement can be violated. This […]
Automation Corner

Structure is EVERYTHING!

May 17, 2014 Michael Schwartz
So what is good structure in software? What makes one language, design or architecture better than another? These are all very difficult questions to answer. So far, I have not found a litmus test; but […]
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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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