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UCF Develops the World’s First Optical Oscilloscope | University of Central Florida News

December 15, 2021 Office
A team from UCF has developed the world’s first optical oscilloscope, an instrument that is able to measure the electric field of light. The device converts light oscillations into electrical signals, much like hospital monitors […]
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Diode lasers for optical metrology | PTB.de

November 4, 2021 Office
PTBnews 03.2021 — In collaboration with an industrial partner, PTB has developed and assessed a very compact wavelength standard. This standard is based on a diode laser whose frequency is stabilized to transitions of the […]
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Escape From Flatland: Calibration Method Enables Microscopes to Make Accurate Measurements in All 3 Dimensions | NIST

June 24, 2021 Office
June 24, 2021 Conventional microscopes provide essential information about samples in two dimensions — the plane of the microscope slide. But flat is not all that. In many instances, information about the object in the […]
News

A Better Way to Measure Acceleration | NIST

March 11, 2021 Office
You’re going at the speed limit down a two-lane road when a car barrels out of a driveway on your right. You slam on the brakes, and within a fraction of a second of the […]
White Papers

Meeting the Challenge when Measuring Super Smooth Surfaces

August 26, 2020 Office
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]
News

JILA Team Demonstrates Model System for Distribution of More Accurate Time Signals | NIST

October 30, 2019 Office
October 21, 2019, NIST News – JILA physicists and collaborators have demonstrated the first next-generation “time scale” — a system that incorporates data from multiple atomic clocks to produce a single highly accurate timekeeping signal […]
News

ABB helping the world obtain a deeper understanding of galaxy evolution

October 17, 2019 Office
News provided by ABB inc. Oct 17, 2019, 08:00 MDT QUEBEC, Oct. 17, 2019 / CNW Telbec / – The ABB cryogenic scanning mirror mechanism would be part of the Space Infrared Telescope for Cosmology […]
Product Announcements

Anritsu Company Introduces Modular Opto-electronic Network Analyzer

September 25, 2019 Office
News provided by Anritsu Company Sep 25, 2019, 12:01 MDT MORGAN HILL, Calif., Sept. 25, 2019 /PRNewswire/ — Anritsu Company introduces the ME7848A Opto-electronic Network Analyzer (ONA) system, a flexible solution integrating the VectorStar® vector […]

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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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