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Home2010July

Month: July 2010

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17-3 (Jul 2010)

Micro-Feature Dimensional and Form Measurements with the NIST Fiber Probe on a CMM

July 1, 2010 Office
The NIST fiber probe is a Coordinate Measuring Machine (CMM) probing system intended for diameter and form measurement of micro features and small holes. The Moore M48 CMM at NIST can measure holes down to […]
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17-3 (Jul 2010)

Calibration Management in the ISO/IEC 17025 Accredited Facility

July 1, 2010 Office
Whether your quality practices are guided by the need for compliance with the FDA, ISO 9001 or ISO/IEC 17025, a calibration management software solution can be an important central element of your integrated quality system.
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17-3 (Jul 2010)

Establishment of a Programmable Calibration System for Accurate AC Current Measurements at NIS, Egypt

July 1, 2010 Office
National Institute of Standards (NIS), Egypt. The system consists mainly of a fabricated thermal current converter (TCC) associated with a definite hardware and a flexible software. The new system has been harmonized to cover a […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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