January 31, 2020 – Ottawa, Ontario – National Research Council of Canada Business leaders, researchers, and students today celebrated the launch of the Joint Centre for Extreme Photonics (JCEP) in Ottawa. Established by the National […]
USB VNA is the next generation of advanced RF test & instrumentation. Performance, form factor, security and lower cost of ownership make these analyzers ideal for many RF and microwave applications. USB VNAs separate the […]
I have been writing custom metrology software for the last 20 years. And over the years, I have learned better, more efficient ways to write custom software. With every iteration, we discovered new ways to […]
By Hening Huang A variety of statistical methods are available for estimating consensus values in interlaboratory studies (including key comparisons). These methods, although developed based on different approaches and ranging from simple to complex, produce […]
By Dennis Destefan and William Hinton It is well accepted in the metrology community that industry does not have a sustainable source of trained calibration professionals. We explore the availability of metrology-related training and its […]
By Hannah Eilers Where can you find the latest metrology news and information, introductory to NMI-level training, and valuable industry connections? All of this can be achieved at annual trade shows. And believe it or […]
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