June 2025 – Cal Lab Magazine

NIST Group Finds New Home

June 24, 2025 Sita Schwartz

The scientific community was shocked to learn this past March that the NIST Atomic Spectroscopy Group would be subject to the new government efficiency cuts. Providing the global scientific community with a continually updated atomic […]

An All-In-One Automatic Multiple Standard for Artifact Calibration of High End Electrical Instruments

June 24, 2025 Office

by Flavio Galliana & Alessio Pollarolo An automated temperature-controlled DC Voltage-DC Resistance Multiple Standard (VRMS) for artifact calibration of high end calibrators and multimeters was developed by Measurements International (MI) with the support of the […]

Deadweight Primary Standards: Best Practices and Their Associated Risks for Stability Determination in Compliance with ISO/IEC 17025

June 24, 2025 Office

by Henry Zumbrun This paper explores the hierarchy, standards, and long-term stability of deadweight primary standard force machines used in load cell calibration. While many understand the basic principles of load cell calibration, fewer fully […]

New Accreditation Tool for Auditors and Laboratory Personnel

June 24, 2025 Office

by Christopher L. Grachanen Calibration and Testing laboratories seeking accreditation status or maintaining their existing accreditation status must comply with the requirements denoted in ISO/IEC 17025 General requirements for the competence of testing and calibration […]

Month: June 2025

NIST Group Finds New Home

An All-In-One Automatic Multiple Standard for Artifact Calibration of High End Electrical Instruments

Deadweight Primary Standards: Best Practices and Their Associated Risks for Stability Determination in Compliance with ISO/IEC 17025

New Accreditation Tool for Auditors and Laboratory Personnel

Talk About Fast!

Additel Launches the ADT835 Portable Calibration Bath: Precision Meets Portability

New FSWX signal and spectrum analyzer with novel architecture overcomes limits of today’s analysis methods

DFB pro 633 – Mode-Hop Free DFB Laser for Semiconductor Metrology and Interferometry