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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ August 24, 2026 ] Surface Roughness, Texture, and Tribology Online & Independent Study
  • [ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
  • [ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
  • [ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
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Home2025September

Month: September 2025

Product Announcements

Mensor Introduces New Multi-Functional Precision Thermometer, Model CTR4000

September 30, 2025 Office
SAN MARCOS, Texas, September 24, 2025 (Newswire.com) – Mensor is proudly expanding our temperature measuring instruments with the new Model CTR4000 multi-functional precision thermometer. This instrument delivers high-accuracy temperature measurement and supports a range of […]
Articles

Automating Calibration with LabVIEW:A Practical Guide for Calibration Laboratories – 2nd Continuum

September 16, 2025 Office
by AjayVignesh Manonmani Velumani, CLA Hello again, fellow metrologists and calibration enthusiasts! I’m thrilled to continue our journey into the world of automated calibration with LabVIEW. In our previous article, “Automating Calibration with LabVIEW: A […]
Articles

Metrology and Meteorology: Measuring Hurricanes

September 16, 2025 Office
by Jeffrey R. Carlson, A.T. Imagine a homeowner, waiting for the hurricane to come, fixated on news reports advising evacuation, yet the evacuation zones are constantly changing due to the storm’s path shifting. Gas stations […]
Articles

Calibration Supplier Complaint – An Accreditation Case Study

September 16, 2025 Office
by Christopher L. Grachanen The following is a case study involving an accredited calibration supplier, hereby referred to as the cal lab, an accreditation testing facility hereby referred to as the test lab, an accreditation […]
In Days of Old

That Wild, Wild, Westinghouse

September 16, 2025 Office
by Dan Wiswell When considering this article, I thought I’d give you all a short summer read and present a few instruments that I don’t focus on very much. Thinking back on subjects I’ve previously […]
Automation Corner

AI Needs Well-Formatted Data

September 16, 2025 Michael Schwartz
A couple of months ago, I presented at NCSLI on AI (Artificial Intelligence) and why AI doesn’t work so well in Metrology. At the heart of the problem is the mess of unstructured data. Large […]
Product Announcements

Keysight Introduces Frequency Extenders and Calibration Kit to Extend Broadband VNA up to 250 GHz

September 11, 2025 Office
SANTA ROSA, Calif., SEPTEMBER 9, 2025  Keysight Technologies, Inc. (NYSE: KEYS) introduces two new millimeter-wave frequency extender modules, the NA5305A Frequency Extender up to 170 GHz and NA5307A Frequency Extender up to 250 GHz, and the 85065A Precision Calibration […]
News

On-wafer metrology for high-frequency circuits | PTB News

September 5, 2025 Office
PTB News 3.2025 – To date, it has not been possible to compare on-wafer measurements because the measuring equipment and laboratory conditions significantly differ from each other and there have not been any reference substrates. […]

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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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