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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
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  • [ September 3, 2026 ] On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions Articles
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Related Articles

Articles

On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions

September 3, 2026 Office Articles, Vol. 33:3 (Jul 2026)
by Manuel Rodriguez Higuero The Guide to the Expression of Uncertainty in Measurement (GUM) [1] and its Supplement 1 based on Monte Carlo propagation (GUM-S1) [2] currently coexist as two conceptual frameworks that are partially […]
Product Announcements

NAPT Announces Game-Changing Proficiency Testing Risk Analysis Module

June 4, 2025 Office Product Announcements
Eagan, MN, June 4, 2025 – The National Association for Proficiency Testing (NAPT), the most trusted name in the metrology community for providing administration, development, software tools, and support for interlaboratory comparisons, is excited to […]
Freeware

Units Converter – from Newton Metrology

January 1, 2011 Admin Freeware
Visit  http://www.newtonmetrology.com/ to download the free Units Converter 2.08. Newton Metrology provides consultation and software for: Uncertainty Estimation using GUM and Monte-Carlo Prediction of Standard Calibration Interval Analysis Calibration per ISO 17025 using VISA in […]
  • What Calibration Evidence Can—and Cannot—Tell You When Buying Used Test Equipment
  • Setting Calibration Intervals from Your As-Found Data
  • Practical Use of Dry Block Calibrators
  • On the Probabilistic Interpretation of Type A Uncertainty: A Proposal for Normalization of Student’s t Distributions
  • The Goal Posts, the Wind, and the Coin Flip: A Practical Guide to Measurement Decision Risk
  • Hard Work Pays in the End
  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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