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Related Articles

Articles

Dimensional Measurement Uncertainty from Data, Part 1: Check Standards

September 7, 2015 Office Articles, Vol. 22:3 (Jul 2015)
by Ted Doiron Uncertainty has proven difficult to implement in calibrations labs. The subject has advanced mathematics and statistics that are often needed for scientific research, but are seldom needed to develop uncertainty budgets for […]
White Papers

Meeting the Challenge when Measuring Super Smooth Surfaces

August 26, 2020 Office White Papers
While the measurement of super smooth surfaces typically requires the use of optical metrology tools, it is important to realize that not all optical solutions are the same. The metrology option chosen for such surfaces […]
Articles

More on the t-Interval Method and Mean-Unbiased Estimator for Measurement Uncertainty Estimation

June 27, 2018 Office Articles, Vol. 25:2 (Apr 2018)
by Hening Huang This paper further explores the t-interval method and the mean-unbiased estimator for uncertainty estimation with a small number of measurements.  It describes the logic behind the error bound-based definition of uncertainty, which […]
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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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