Vol. 32:3 (Jul 2025) – Cal Lab Magazine

Latest Posts

[ January 31, 2020 ] Why USB VNAs? White Papers
[ August 24, 2026 ] Surface Roughness, Texture, and Tribology Online & Independent Study
[ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
[ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
[ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
[ July 1, 2026 ] Vitrek Introduces Intelligent Cable Test Automation Solution Product Announcements

Automating Calibration with LabVIEW:A Practical Guide for Calibration Laboratories – 2nd Continuum

September 16, 2025 Office

by AjayVignesh Manonmani Velumani, CLA Hello again, fellow metrologists and calibration enthusiasts! I’m thrilled to continue our journey into the world of automated calibration with LabVIEW. In our previous article, “Automating Calibration with LabVIEW: A […]

Metrology and Meteorology: Measuring Hurricanes

September 16, 2025 Office

by Jeffrey R. Carlson, A.T. Imagine a homeowner, waiting for the hurricane to come, fixated on news reports advising evacuation, yet the evacuation zones are constantly changing due to the storm’s path shifting. Gas stations […]

Calibration Supplier Complaint – An Accreditation Case Study

September 16, 2025 Office

by Christopher L. Grachanen The following is a case study involving an accredited calibration supplier, hereby referred to as the cal lab, an accreditation testing facility hereby referred to as the test lab, an accreditation […]

That Wild, Wild, Westinghouse

September 16, 2025 Office

by Dan Wiswell When considering this article, I thought I’d give you all a short summer read and present a few instruments that I don’t focus on very much. Thinking back on subjects I’ve previously […]

AI Needs Well-Formatted Data

September 16, 2025 Michael Schwartz

A couple of months ago, I presented at NCSLI on AI (Artificial Intelligence) and why AI doesn’t work so well in Metrology. At the heart of the problem is the mess of unstructured data. Large […]