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  • [ January 31, 2020 ] Why USB VNAs? White Papers
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April 21, 2023 Office Resumes
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Related Articles

Articles

Project LiBforSecUse: Quality Assessment of Electric Vehicle Lithium Ion Batteries for Second Use Applications

May 12, 2022 Office Articles, Vol. 29:2 (Apr 2022)
by Stanislav Mašláň, Gareth Hinds, Mohamed Ouameur, Frédéric Overney This paper introduces the European project LiBforSecUse, which is focused on metrology requirements for impedance spectroscopy of commercial Li-ion cells for second life applications. It focuses […]
News

A material measure for optical surface measurement – PTB.de

March 8, 2022 Office News
PTnews 1.2022 – The measurement responses of optical measuring devices to surface topography can be described by the instrument transfer function (ITF). At PTB, a novel material measure has been developed to characterize two-dimensional instrument […]
Photo of the front of the Vitrek 4700 Precision High Voltage Meter
Product Announcements

Vitrek 4700 Makes Compliance Simpler & Less Costly

December 5, 2025 Office Product Announcements
Lockport, IL, December 4, 2025 – Vitrek’s 4700 Precision High Voltage Meter is gaining recognition as the simplest deployment-ready solution for laboratories looking to achieve ISO/IEC 17025—a compliance requirement needed for a growing number of […]
  • Summit Technology Highlights PK4564-PRO System for Complete Electrical & Power Services Power and Power-Quality Data Gathering and Analysis
  • Cal-Toons 2027 Calendar
  • Fluke Introduces New Refrigerated Temperature Calibration Baths for High-Accuracy Temperature Sensor Testing
  • New Chip-Based ‘Tape Measure’ for Light Could Revolutionize Mobile Timekeeping and Enhance National Security | NIST News
  • Selecting the Right Calibration Method for VNA Measurement
  • The 28th Meeting of the CGPM
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business digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature time & frequency
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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