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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ August 24, 2026 ] Surface Roughness, Texture, and Tribology Online & Independent Study
  • [ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
  • [ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
  • [ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
  • [ July 1, 2026 ] Vitrek Introduces Intelligent Cable Test Automation Solution Product Announcements
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Madelyne M.H. Markham

Seeking employment opportunity

April 21, 2023 Office Resumes
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Efficient calibration technician with applicable military experience, seeking position as a Calibration Technician in Denver, CO.

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News

On-wafer metrology for high-frequency circuits | PTB News

September 5, 2025 Office News
PTB News 3.2025 – To date, it has not been possible to compare on-wafer measurements because the measuring equipment and laboratory conditions significantly differ from each other and there have not been any reference substrates. […]
Product Announcements

Starrett Introduces Easy-to-Use Precision Wireless Electronic Depth Gages

November 3, 2023 Office Product Announcements
ATHOL, MA U.S.A. (November 3, 2023) – The L.S. Starrett Company, a leading global manufacturer of precision measuring tools and gages, metrology systems and more, has introduced three Wireless Electronic Depth Gages including the W640JZ, […]
Articles

Choosing the Proper Measurement Tool

April 30, 2020 Office Articles, Vol. 27:1 (Jan 2020)
by Joseph P. Fuehne, Ph.D., P.E. The Purdue Polytechnic Institute in Columbus utilizes metrology tools with targeted measurement artifacts, which may be 3-D printed or machined, to facilitate learning and provide opportunities to demonstrate competency […]
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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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About Us
Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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