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Latest Posts
  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ August 24, 2026 ] Surface Roughness, Texture, and Tribology Online & Independent Study
  • [ August 12, 2026 ] Axiospec Releases Free Suite of 15 Metrology Calculators Freeware
  • [ August 10, 2026 ] NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News News
  • [ July 31, 2026 ] Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer Product Announcements
  • [ July 1, 2026 ] Vitrek Introduces Intelligent Cable Test Automation Solution Product Announcements
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Product Announcements

Rohde & Schwarz presents a new power sensor module for calibration tasks up to 50 GHz

November 12, 2025 Office
Munich 12-Nov-2025 The new R&S NRP-Z47 power sensor module from Rohde & Schwarz turns an R&S FSMR3000 measuring receiver into a precision power meter with a wide dynamic range from –23 dBm to +30 dBm. Providing […]
Product Announcements

Anritsu Breaks Bandwidth Barrier with World’s First 145 GHz O/E Calibration Module, Accelerating 1.6T Data Center Evolution

October 28, 2025 Office
Morgan Hill, CA– October 28, 2025 – Anritsu Company has launched the MN4765B-0140 O/E Reference Calibration Module, the world’s fastest and first traceable solution to support the testing demands of next-generation data centers and the explosive […]
Product Announcements

Keysight Introduces Frequency Extenders and Calibration Kit to Extend Broadband VNA up to 250 GHz

September 11, 2025 Office
SANTA ROSA, Calif., SEPTEMBER 9, 2025  Keysight Technologies, Inc. (NYSE: KEYS) introduces two new millimeter-wave frequency extender modules, the NA5305A Frequency Extender up to 170 GHz and NA5307A Frequency Extender up to 250 GHz, and the 85065A Precision Calibration […]
News

On-wafer metrology for high-frequency circuits | PTB News

September 5, 2025 Office
PTB News 3.2025 – To date, it has not been possible to compare on-wafer measurements because the measuring equipment and laboratory conditions significantly differ from each other and there have not been any reference substrates. […]
News

All In One: NIST Develops Single Device to Realize Electrical Standards | NIST

September 4, 2025 Office
August 12, 2025 NIST Updates – Researchers at the National Institute of Standards and Technology (NIST) have developed one of the first all-in-one instruments for realizing the most up-to-date standards for voltage, resistance, and current. […]
Product Announcements

Fluke Expands Calibration Portfolio with New Solutions to Enhance Efficiency and Precision

August 28, 2025 Office
EVERETT, Wash., August 28, 2025 – Fluke Corporation announced a new addition to its 55XX multi-product calibrator series with the Fluke 5530A Basic Multi-Product Calibrator. Designed for calibration and metrology technicians, the 5530A targets industrial calibration workloads at a […]
Articles

An All-In-One Automatic Multiple Standard for Artifact Calibration of High End Electrical Instruments

June 24, 2025 Office
by Flavio Galliana & Alessio Pollarolo An automated temperature-controlled DC Voltage-DC Resistance Multiple Standard (VRMS) for artifact calibration of high end calibrators and multimeters was developed by Measurements International (MI) with the support of the […]
Product Announcements

New FSWX signal and spectrum analyzer with novel architecture overcomes limits of today’s analysis methods

June 13, 2025 Office
Munich | 13-Jun-2025 — Rohde & Schwarz is set to revolutionize the field of signal and spectrum analysis with the launch of the FSWX signal and spectrum analyzer, an innovative instrument designed to overcome the […]

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  • Surface Roughness, Texture, and Tribology
  • Axiospec Releases Free Suite of 15 Metrology Calculators
  • NIST Researchers Correct Common Error Confounding Nanotech Measurements | NIST News
  • Yokogawa Test & Measurement Releases WT1500 Precision Power Analyzer
  • Vitrek Introduces Intelligent Cable Test Automation Solution
  • Cal Lab Solutions, Inc. Introduces AuditReady™
  • Mahr Inc. Introduces MarSurf3D MS Optical Metrology Platform Featuring Multisensor Technology 
  • The first stable version of the SI Reference Point | BIPM News
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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Cal Lab Magazine is a quarterly publication that covers measurement science and instrument calibration for managers, engineers, and technicians. Since 1994, Cal Lab Magazine continues to cover international standards, calibration techniques and new technology for measurement areas: electrical, dimensional, temperature, pressure, flow and mass. This web site is an online extension of the printed magazine, offering a calendar of worldwide conferences and seminars, resource links, industry news, and articles.
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