national metrology institutes – Page 6

To Break New Ground With Frequency Combs, a NIST Innovation Plays With the Beat | NIST

October 24, 2022 Office

An improvement to a Nobel Prize-winning technology called a frequency comb enables it to measure light pulse arrival times with greater sensitivity than was previously possible — potentially improving measurements of distance along with applications […]

Human- and machine-readable KC reports using the PDF/A-3 format | BIPM

September 30, 2022 Office

The BIPM is pleased to announce the publication of the first key comparison report embedding machine-readable (XML and JSON) versions of the document. Use of the PDF/A-3 standard in this way was originally suggested by […]

Improving accuracy of international standards for graphene | NPL News

June 14, 2022 Office

The results of the first international comparison of the measurement of graphene have been published in 2D Materials, led by NPL, through the Versailles Project on Advanced Materials and Standards (VAMAS) and in collaboration with […]

Discover NIST Education Resources! | NIST

May 27, 2022 Office

The National Institute of Standards and Technology (NIST) invites learners of all ages to explore and discover a wide variety of Science, Technology, Engineering, and Mathematics (STEM) resources using the recently launched Education portal and […]

NIST Finds Wireless Performance Consistent Across 5G Millimeter-Wave Bands | NIST

May 24, 2022 Office

Settling a key dispute in the wireless communications field, researchers at the National Institute of Standards and Technology (NIST) found that transmission performance is consistent across different bands of the millimeter-wave (mmWave) spectrum targeted for […]

2nd Edition Released for Measurement Uncertainty: A Reintroduction

April 20, 2022 Office

A much enlarged second edition of Measurement Uncertainty: A Reintroduction, by Antonio Possolo (NIST) and Juris Meija (NRC Canada) was released April 6, 2022. An inter-American collaboration, the publisher is Sistema Interamericano de Metrologia (SIM) […]

A material measure for optical surface measurement – PTB.de

March 8, 2022 Office

PTnews 1.2022 – The measurement responses of optical measuring devices to surface topography can be described by the instrument transfer function (ITF). At PTB, a novel material measure has been developed to characterize two-dimensional instrument […]

Quantum-calibrated magnetic force microscopy – PTB.de

March 8, 2022 Office

PTBnews 1.2022 – A classical measurement system for measuring magnetic field distributions, which vary spatially on the nanometer scale, was calibrated by means of an atomic quantum sensor for the first time. This new calibration […]