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  • [ January 31, 2020 ] Why USB VNAs? White Papers
  • [ May 27, 2026 ] Beyond 4:1: What Calibration Ratios Were Meant to Do Articles
  • [ May 27, 2026 ] Metrology for Newbs: Entering the Community, Not Just the Career Articles
  • [ May 27, 2026 ] Resistance Decade Boxes – Where and How They are Used Articles
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Home2020

Year: 2020

White Papers

Fundamentals of Electrical Safety Testing – Pt. 1

April 27, 2020 Office
Introduction Electrical safety testers – often referred to as “hipot” testers – are an integral part of electrical and electronic equipment manufacturing. Hipot testers get their name from the high-potential (high voltage) they produce to […]
News

Helmholtz Prize for high-precision measurements of the theory of relativity and nanomaterials – PTB.de

April 8, 2020 Office
From fundamental physics related to Einstein’s special theory of relativity to fundamentals of metrological applications in the range of thousandths of micrometers (i.e. nanometers) – the bandwidth of this year’s Helmholtz Prize is considerable. The […]
Product Announcements

Introducing the Ralston Instruments ControlPak Manual pressure controller

April 8, 2020 Office
The ControlPak is a compressed gas volume controller that can really take a beating. It provides precise control over compressed gas sources for smooth and quick calibration testing. Encased in durable, tactical plastic designed to […]
News

A different way of measuring pressure – PTB.de

April 8, 2020 Office
PTBnews 1.2020 – Within the scope of the work on the redefinition of the base unit kelvin, PTB developed a new method for pressure measurement based on the capacitance measurement of helium gas. From the […]
News

Electrical characterisation of graphene – NPL

March 30, 2020 Office
Scientists from NPL, in collaboration with Instituto Nazionale di Ricerca Metrologica (Italy), Graphenea SA (Spain), Das-Nano (Spain), delivered the EMPIR Grace project with the aim of developing novel metrology for electrical characterisation of graphene, to […]
Product Announcements

Starrett Rotary Table Springs Force Tester

March 24, 2020 Office
ATHOL, MA U.S.A. (March 24, 2020) – The L.S. Starrett Company, a leading global manufacturer of precision hand tools/ gages, a broad range of force testing, metrology equipment, and more, has introduced a newly designed […]
Product Announcements

Mensor Introduces the New CPT6030 Analog Pressure Transducer

March 23, 2020 Office
The CPT6030 Analog Pressure Transducer is the newest offering in Mensor’s lineup of precision pressure transducers. The CPT6030 is a one-of-its-kind precision measurement device with true 2-wire 4 – 20 mA pressure output with accuracy […]
Product Announcements

Rohde & Schwarz presents new test solutions for 5G base stations

March 23, 2020 Office
Munich 23-Mar-2020 – Rohde & Schwarz is continuously extending its portfolio of test solutions for 5G base stations and the associated massive MIMO antenna arrays and amplifiers. Highlights include an OTA test solution with frontend […]

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  • Beyond 4:1: What Calibration Ratios Were Meant to Do
  • Metrology for Newbs: Entering the Community, Not Just the Career
  • Resistance Decade Boxes – Where and How They are Used
  • Digitalizing the Bench: Why the Future of Metrology is Model-Driven
  • MSL Uncertainty Calculator
  • Druck Launches UPS4E-IS, the World’s Only Intrinsically Safe Pocket-Size Loop Calibrator
  • Metrology and Quality Through Education
  • Renishaw to showcase robot efficiency solutions and advanced gauging systems at Automate 2026
business calibration training digitalization dimensional Education electrical flow force Force & Torque freeware general industry standards ISO/IEC 17025 mass & weight measurement uncertainty Metrology 101 national metrology institutes news optical photometry pressure pressure & flow RF & Microwave software temperature
  • Office: A reader noticed the tolerances were not correct. Lower and upper limits in the table of the article have now…
  • Office: Thank you Kent! ~Sita
  • marlett-NSTec: In the article “Learning to Apply Metrology Principles to the Measurement of X-ray Intensities in the 500 eV to 110…
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